Intrinsic Defects in Silicon Carbide Polytypes

• 17 January 2001
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 353-356, 499-504
• https://doi.org/10.4028/www.scientific.net/msf.353-356.499

Abstract

Keywords

• ANTISITE
• ELECTRON IRRADIATION
• ELECTRON PARAMAGNETIC RESONANCE (EPR)
• VACANCY