Thin film X-ray fluorescence calibration standards

• 15 December 1979
• journal article
• Published by Elsevier in Nuclear Instruments and Methods
• Vol. 167  (1) , 137-138
• https://doi.org/10.1016/0029-554x(79)90493-2

Abstract

Keywords

• THIN FILM
• SPECTRUM
• STANDARDS FOR CALIBRATION
• SILICON
• ABSORPTION
• PARTICLE SIZE
• FLUORESCENCE
• POLLUTION