Multiple Scattering from Rough Dielectric and Metal Surfaces Using the Kirchhoff Approximation
- 1 August 1991
- journal article
- research article
- Published by Taylor & Francis in Journal of Modern Optics
- Vol. 38 (8) , 1471-1481
- https://doi.org/10.1080/09500349114551641
Abstract
The Kirchhoff double-scatter method for calculating the intensity distribution scattered from a rough surface is extended to dielectric and metal surface materials. The material properties are contained in the Fresnel reflection coefficients only. It is shown that the results agree well with calculations using the exact method for a surface of Gaussian statistics with standard deviation of height σ = 1·93λ and 1/e correlation length τ = 5·02λ.Keywords
This publication has 7 references indexed in Scilit:
- Multiple Scattering from Random Rough Surfaces Using the Kirchhoff ApproximationJournal of Modern Optics, 1991
- Experimental study of enhanced backscattering from one- and two-dimensional random rough surfacesJournal of the Optical Society of America A, 1990
- Comparison of surface scattering between identical, randomly rough metal and dielectric diffusersOptics Letters, 1989
- Experimental study of scattering from characterized random surfacesJournal of the Optical Society of America A, 1987
- Observation of depolarization and backscattering enhancement in light scattering from gaussian random surfacesOptics Communications, 1987
- The validity of shadowing corrections in rough surface scatteringRadio Science, 1984
- Scattering at a rough boundary—Extensions of the Kirchhoff approximationThe Journal of the Acoustical Society of America, 1982