Experimental evaluation of a novel CdZnTe flat-panel x-ray detector for digital radiography and fluoroscopy
- 28 June 2001
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 4320, 140-148
- https://doi.org/10.1117/12.430924
Abstract
We made a prototype flat-panel X-ray detector with a polycrystalline CdZnTe film, and evaluated its imaging performance with respect to leakage current, X-ray sensitivity, MTF, DQE and image lag. The detector incorporates a novel hybrid technique in which zinc-doped CdTe is pre-deposited onto a ceramic substrate and then connected to a TFT circuit substrate. We carefully selected the material for the sensor substrate in order to avoid both incident x-ray attenuation in the substrate and micro-cracks in CdZnTe film. The film thickness was approximately 300 micrometers . The imaging area is composed of 512 X 384 pixels, with a pixel pitch of 150 micrometers .Keywords
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