Observations of Laue pattern and stability of beta -C3N4grains

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Abstract
Carbon nitride films have been prepared by ion beam assisted deposition with high N-ion fluxes up to the order of 1 mA cm-2. Both Auger electron spectroscopy and Rutherford backscattering spectroscopy measurements show that an average nitrogen concentration of up to 45 at.% has been incorporated into the films. The nitrogen concentration in some local areas reaches as high as 59 at.% examined by energy-dispersive X-ray analysis. In such a high nitrogen content area, Laue spots of the predicted beta -C3N4 structure have been observed for the first time by transmission electron microscopy. Under continuous electron irradiation, beta -C3N4 grains refine to dimensions of <0.1-0.4 mu m in diameter.