CMOS circuit testability
- 1 April 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 21 (2) , 306-309
- https://doi.org/10.1109/jssc.1986.1052520
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A CMOS LSSD test generation systemIBM Journal of Research and Development, 1984
- Fault Modeling and Logic Simulation of CMOS and MOS Integrated CircuitsBell System Technical Journal, 1978