Effect of grain-boundary scattering on the electrical resistivity of indium films
- 1 May 1976
- journal article
- conference paper
- Published by Springer Nature in Journal of Materials Science
- Vol. 11 (5) , 872-876
- https://doi.org/10.1007/bf00542304
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Electrical resistivity of polycrystalline bismuth filmsJournal of Vacuum Science and Technology, 1974
- Size-effect parameters for thin films of the aluminium group metalsSolid State Communications, 1973
- Internal stresses and resistivity of low-voltage sputtered tungsten filmsJournal of Applied Physics, 1973
- On the electrical resistivity of evaporated thin cobalt films; an approach based on the Mayadas-Shatzkes modelSurface Science, 1973
- Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External SurfacesPhysical Review B, 1970
- Temperature Dependency of Resistance of Thin Metal FilmsJournal of Applied Physics, 1963
- The mean free path of electrons in metalsAdvances in Physics, 1952
- The conductivity of thin wires in a magnetic fieldProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1950
- The conductivity of thin metallic films according to the electron theory of metalsMathematical Proceedings of the Cambridge Philosophical Society, 1938