An overlapping electrode buried channel CCD

• 1 January 1973
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 24-26
• https://doi.org/10.1109/iedm.1973.188637

Abstract

Keywords

• ELECTRODES
• CHARGE COUPLED DEVICES
• SILICON
• INSULATION
• ALUMINUM
• VOLTAGE
• INTERFACE STATES
• CIRCUITS
• ETCHING
• DIODES