Electron localization on a liquid-helium surface

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Abstract
A theoretical treatment is given of the localization or self-trapping of the motion of electrons bound in extrinsic surface states on liquid helium. For a thin helium film (∼ 100 Å) on a substrate we find a trapping energy of about 8 K. We investigate the breakdown of very thin films and show that in the bulk case an earlier estimate of the trapping energy by Shikin must be revised.