Total Ionizing Dose Effects In 12-bit Successive-approxmation Analog-to-digital Converters
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 112-117
- https://doi.org/10.1109/redw.1993.700576
Abstract
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This publication has 1 reference indexed in Scilit:
- Considerations for Hardening MOS Devices and Circuits for Low Radiation DosesIEEE Transactions on Nuclear Science, 1980