Diffusion of silver in C60 thin films

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Abstract
The diffusion of silver atoms into C60 solid thin films is observed. The diffusion process is significant at temperatures just above room temperature, with an activation energy of 2.5±0.5 eV (60 kcal/mol). Temperature dependent conductivity measurements indicate that silver atoms form an impurity band in solid C60 with an activation energy of 0.26 eV. The ready interdiffusion of silver and C60 may have important implications in the formation of C60/metal contacts or C60/metal layered structures or materials.