X-ray microanalytical senstivity and spatial resolution in scanning transmission electron microscopes
- 1 October 1978
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 7 (4) , 184-189
- https://doi.org/10.1002/xrs.1300070403
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Improved spatial resolution microanalysis in a scanning transmission electron microscopeX-Ray Spectrometry, 1977
- A simple Monte Carlo method for simulating electron-solid interactions and its application to electron probe microanalysisJournal of Physics D: Applied Physics, 1977
- Quantitative X-ray energy dispersive analysis with the transmission electron microscopeX-Ray Spectrometry, 1975
- Multiple scattering of 5 - 30 keV electrons in evaporated metal films III: Backscattering and absorptionBritish Journal of Applied Physics, 1965
- The angular distribution of characteristic x radiation and its origin within a solid targetProceedings of the Physical Society, 1964
- The Intensity of Emission of Characteristic X-RadiationProceedings of the Physical Society. Section A, 1956