Carbon nanotubes as probes for atomic force microscopy
- 7 January 2000
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 11 (1) , 1-5
- https://doi.org/10.1088/0957-4484/11/1/301
Abstract
Tip-derived artifacts remain one of the chief limitations of atomic force microscopy (AFM) when attempting to measure sub-nanometre structures. Carbon nanotubes represent ideal structures for use as AFM tips because of their small diameter, high aspect ratio and high strength. We attached single carbon nanotube AFM tips using a novel arc discharge method. Using these modified tips, we successfully imaged a protein filament found in sponge spicules of Tethya aurantia . We report a modular stave-like structure for the protein filament that was previously unobservable with conventional AFM cantilevers.Keywords
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