A method for characterizing a microprocessor's vulnerability to SEU
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 35 (6) , 1678-1681
- https://doi.org/10.1109/23.25521
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- The SEU and Total Dose Response of the INMOS TransputerIEEE Transactions on Nuclear Science, 1987
- The SEU Risk Assessment of Z80A, 8086 and 80C86 Microprocessors Intended for Use in a Low Altitude Polar OrbitIEEE Transactions on Nuclear Science, 1986
- Techniques of Microprocessor Testing and SEU-Rate PredictionIEEE Transactions on Nuclear Science, 1985
- SEU Vulnerability of the Zilog Z-80 and NSC-800 MicroprocessorsIEEE Transactions on Nuclear Science, 1985