Method of Correction for the α1 α2 Doublet in the X-Ray Diffraction Lines
- 1 May 1955
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 26 (5) , 423-426
- https://doi.org/10.1063/1.1771316
Abstract
In many applications it is necessary to determine the diffraction pattern due to monochromatic radiation. When the x-ray beam contains two frequencies α1 and α2, the experimental pattern P(2θ) equals the sum of the contributions f(2θ) and kf(2θ−δ) of the α1 and α2 components. In this paper a graphical method of determining f(2θ) from P(2θ) is given, with the assumption that f(2θ) is symmetrical. The area A(2θ) under the P(2θ) curve is plotted, from which the position of the maximum and the shape of f(2θ) is easily determined. In this construction it is not necessary for P(2θ) to have a well-defined zero.Keywords
This publication has 5 references indexed in Scilit:
- The Effect of Cold-Work Distortion on X-Ray PatternsJournal of Applied Physics, 1950
- A Correction to the Diameter Measurement of Diffuse X-Ray Diffraction RingsNature, 1949
- A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder PhotographsProceedings of the Physical Society, 1948
- A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction LinesJournal of Scientific Instruments, 1948
- The measurement of particle size by the X-ray methodProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1938