Detection limits of external beam PIXE in the analysis of thick samples for elements withZ ≥ 26

• 1 July 1986
• journal article
• research article
• Published by Wiley in X-Ray Spectrometry
• Vol. 15  (3) , 159-166
• https://doi.org/10.1002/xrs.1300150304

Abstract

Keywords

• DETECTION LIMIT