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X-ray tube for crystal analysis and stress measurements
Home
Publications
X-ray tube for crystal analysis and stress measurements
X-ray tube for crystal analysis and stress measurements
JG
J E de Graaf
J E de Graaf
WO
W J Oosterkamp
W J Oosterkamp
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1 September 1938
journal article
Published by
IOP Publishing
in
Journal of Scientific Instruments
Vol. 15
(9)
,
293-303
https://doi.org/10.1088/0950-7671/15/9/303
Abstract
No abstract available
Keywords
SPECTRUM
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Cited by 15 articles
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