AFM and STM activities at advanced technologies center
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 1596-1601
- https://doi.org/10.1016/0304-3991(92)90490-b
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Atomic Force MicroscopePhysical Review Letters, 1986