Growth in ultrahigh vacuum and structural characterization of FeSi2 on Si(111)

• 1 July 1991
• journal article
• Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
• Vol. 9  (4) , 2433-2436
• https://doi.org/10.1116/1.585716

Abstract

Keywords

• MOLECULAR BEAM EPITAXY
• CRYSTAL STRUCTURE
• X RAY DIFFRACTION
• IRON
• EPITAXIAL GROWTH
• ELECTRON DIFFRACTION