XPS and X-ray diffraction studies of aluminum-doped zinc oxide transparent conducting films
- 1 July 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 280 (1-2) , 20-25
- https://doi.org/10.1016/0040-6090(95)08239-5
Abstract
No abstract availableKeywords
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