Wölter x-ray microscope characterization measurements on Nova
- 1 October 1992
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 63 (10) , 5080-5082
- https://doi.org/10.1063/1.1143498
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Four-frame gated Wolter x-ray microscopeReview of Scientific Instruments, 1990
- High-energy x-ray response of photographic films: models and measurementJournal of the Optical Society of America B, 1986
- Nova experimental facility (invited)Review of Scientific Instruments, 1986
- Spiegelsysteme streifenden Einfalls als abbildende Optiken für RöntgenstrahlenAnnalen der Physik, 1952