The Current Limiting Capability of Diffused Resistors
- 1 January 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 26 (6) , 4719-4724
- https://doi.org/10.1109/TNS.1979.4330216
Abstract
An experimental evaluation of the current limiting capability of dielectrically isolated diffused resistors at transient ionizing dose rates up to 6×1012 rads(Si)/ sec is presented. Existing theoretical predictions of the transient response of diffused resistors are summarized and compared to the experimentally measured values. The test resistors used allow the effects of sheet resistance and geometry on the transient response to be determined. The experimental results show that typical dielectrically isolated diffused resistors maintain adequate current limiting capability for use in radiation hardened integrated circuits.Keywords
This publication has 1 reference indexed in Scilit:
- The effects of ionizing radiation on diffused resistorsIEEE Transactions on Nuclear Science, 1974