Extended X-ray fine structure in crystalline copper

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Abstract
The extended X-ray absorption fine structure (EXAFS) above the K absorption edge of copper is measured for a copper single crystal. The study is performed using a highly regulated X-ray source and an improved version of a single-crystal high-angle goniometer. The absorbing Cu crystal is used in the Bragg geometry to serve also as a diffraction crystal in analysing the X-ray spectrum. The experimental results are compared with the theoretical values obtained by applying Fourier analysis to the point-scattering theory.