Interdiffusion in epitaxial Co/Pt multilayers
- 15 January 1997
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 81 (2) , 637-645
- https://doi.org/10.1063/1.364221
Abstract
Interdiffusion kinetics were measured using x-ray diffraction methods in epitaxial (001) and (111) Co/Pt multilayers in which the chemical modulation wavelength was in the range 2.5–4.0 nm. Multilayers were prepared by e-beam evaporation and were subsequently annealed in vacuum at temperatures between 275 and 375 °C. The activation enthalpy of the interdiffusion process in this temperature range was estimated using a novel approach for scaling nonlinear diffusion data. Activation enthalpies for interdiffusion in (001) and (111) multilayers were determined to be 1.1±0.2 and 0.8±0.2 eV, respectively. The low values obtained for the activation enthalpies may result from coherency strains or “short-circuit’’ diffusion in the faulted, epitaxial multilayers.This publication has 24 references indexed in Scilit:
- Interface structure and perpendicular magnetic anisotropy in Pt/Co multilayersJournal of Applied Physics, 1995
- Structure-property correlations in Pt/Co multilayers for magneto-optic recordingJournal of Magnetism and Magnetic Materials, 1994
- Oscillatory magnetic exchange coupling through thin copper layersPhysical Review Letters, 1991
- Magneto-Optical Storage MaterialsMRS Bulletin, 1990
- Co/Pt and Co/Pd ultrathin-multilayered films as new magneto-optical recording materialsIEEE Transactions on Magnetics, 1989
- Perpendicular magnetic anisotropy in Pd/Co thin film layered structuresApplied Physics Letters, 1985
- Interdiffusion in composition-modulated copper-gold thin filmsJournal of Applied Physics, 1977
- Effect of Coherency Strains on Diffusion in Copper-Palladium AlloysJournal of Applied Physics, 1969
- Effect of Gradient Energy on Diffusion in Gold-Silver AlloysJournal of Applied Physics, 1969
- An X-Ray Method of Determining Rates of Diffusion in the Solid StateJournal of Applied Physics, 1940