Hot spot investigations on PV modules-new concepts for a test standard and consequences for module design with respect to bypass diodes
- 23 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1129-1132
- https://doi.org/10.1109/pvsc.1997.654287
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Microplasma breakdown and hot-spots in silicon solar cellsSolar Cells, 1989
- Computer simulation of the effects of electrical mismatches in photovoltaic cell interconnection circuitsSolar Cells, 1988