Submicron-Scale Tip Fabrication for Magnetic Force Microscopy by Electrolytic Polishing
- 1 August 1988
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 27 (8R)
- https://doi.org/10.1143/jjap.27.1546
Abstract
An electrolytic polishing technique which exposes a portion of an insulated wire and etches that portion preferentially is described. The prepared tip's configuration immediately prior to dropping off depends on the tip's weight and mechanical properties. The tip-point curvature can be below-submicron scale. Magnetic force imaging of recorded magnetic tape using these tips is shown.Keywords
This publication has 2 references indexed in Scilit:
- Technique for shaping scanning tunneling microscope tipsReview of Scientific Instruments, 1987
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987