Comments on "On the Analysis of Fault Trees

• 1 June 1976
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
• Vol. R-25  (2) , 126-127
• https://doi.org/10.1109/TR.1976.5215006

Abstract

Keywords

• FAULT TREES
• RELIABILITY THEORY
• BOOLEAN ALGEBRA
• LOGIC CIRCUITS
• RELIABILITY ENGINEERING