Crystallographic heterodyne phase detection for highly sensitive lattice-distortion measurements
- 1 July 1996
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 13 (7) , 1495-1500
- https://doi.org/10.1364/josaa.13.001495
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 14 references indexed in Scilit:
- Phase problem in crystallographyJournal of the Optical Society of America A, 1993
- Phase problems for periodic images: effects of support and symmetryJournal of the Optical Society of America A, 1993
- Spatiotemporal frequency multiplex heterodyne interferometryJournal of the Optical Society of America A, 1992
- Spatial-carrier fringe-pattern analysis and its applications to precision interferometry and profilometry: An overviewIndustrial Metrology, 1990
- Phase retrieval in crystallography and opticsJournal of the Optical Society of America A, 1990
- High Resolution Moire Photography: Application To Dynamic Stress AnalysisOptical Engineering, 1989
- Interferogram analysis using Fourier transform techniquesApplied Optics, 1987
- Computer-based highly sensitive electron-wave interferometryApplied Optics, 1985
- Fourier transform profilometry for the automatic measurement of 3-D object shapesApplied Optics, 1983
- Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometryJournal of the Optical Society of America, 1982