Precision and accuracy of the Bond method as applied to small spherical crystals

• 1 February 1976
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 9  (1) , 1-8
• https://doi.org/10.1107/s002188987601039x

Abstract

Keywords

• SPHEROIDAL
• SILICON
• RAD
• BOND METHOD
• LATTICE PARAMETER MEASUREMENTS
• P.P.M
• HORIZONTAL DIVERGENCE
• CRYSTALS