Design features of an ultrahigh-vacuum electron microscope for REM-PEEM studies of surfaces
- 31 May 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 36 (1-3) , 142-147
- https://doi.org/10.1016/0304-3991(91)90145-v
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Design and development of an ultrahigh vacuum high-resolution transmission electron microscopeUltramicroscopy, 1991
- Photoemission microscopy and atomic steps on Mo{011}Surface Science, 1988
- Surface Structures Observed by High-Resolution UHV Electron Microscopy at Atomic LevelJapanese Journal of Applied Physics, 1987
- Reflection electron microscopyJournal of Applied Crystallography, 1987
- Surface Electronic Structure of Si (111)-(7×7) Resolved in Real SpacePhysical Review Letters, 1986
- Visualization of submonolayers and surface topography by biassed secondary electron imaging: Application to Ag layers on Si and W surfacesSurface Science, 1985
- An analytical reflection and emission UHV surface electron microscopeUltramicroscopy, 1985
- Observation of Surface Micro-Structures by Micro-Probe Reflection High-Energy Electron DiffractionJapanese Journal of Applied Physics, 1984
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983
- System for reflection electron microscopy and electron diffraction at intermediate energiesReview of Scientific Instruments, 1975