Measurement of the modulation transfer function of a slow-scan CCD camera on a TEM using a thin amorphous film as test signal
- 1 August 1996
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 64 (1-4) , 49-55
- https://doi.org/10.1016/0304-3991(96)00014-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Analysis of electron image detection efficiency of slow-scan CCD camerasUltramicroscopy, 1993
- Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopyPhysical Review Letters, 1992
- Methods to measure properties of slow-scan CCD cameras for electron detectionReview of Scientific Instruments, 1992
- Performance of electron image converters with YAG single-crystal screen and CCD sensorUltramicroscopy, 1991
- Electron holography approaching atomic resolutionUltramicroscopy, 1985