Accurate Charge-Density Studies as an Extension of Bayesian Crystal Structure Determination

• 1 November 1998
• journal article
• research article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A Foundations of Crystallography
• Vol. 54  (6) , 971-996
• https://doi.org/10.1107/s010876739800539x

Abstract

Keywords

• PREJUDICE
• CRYSTAL STRUCTURE
• STRUCTURE DETERMINATION
• DISTRIBUTIONS ARE COMPUTED
• PRIOR KNOWLEDGE
• CHARGE DENSITY
• AB INITIO
• COMPUTER PROGRAM
• SILICON
• DISTRIBUTION OF SCATTERERS