Influence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films
- 16 February 2000
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 29 (2) , 155-159
- https://doi.org/10.1002/(sici)1096-9918(200002)29:2<155::aid-sia729>3.0.co;2-g
Abstract
No abstract availableKeywords
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