Electronic properties of the Si-SiO2 interface as a function of oxide growth conditions. II. Fixed charge
- 16 June 1972
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 11 (2) , 669-675
- https://doi.org/10.1002/pssa.2210110230
Abstract
No abstract availableKeywords
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