On the Frequency Dependence of Si2F6 Isotope-Selective Multiphoton Dissociation
- 1 November 1995
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 34 (11A) , L1497
- https://doi.org/10.1143/jjap.34.l1497
Abstract
The laser frequency dependence of the enrichment factors in the separation of silicon isotopes by infrared multiphoton dissociation (MPD) were calculated. Based on the knowledge of the isotopic shifts, a simple model was developed to estimate the dependence of the MPD yield on the laser frequency. The results agree well with the experimental results reported elsewhere. This new method allows us to determine the relative contribution to the MPD yield of the 6 Si2F6 isotopic species and to explain the behavior of the enrichment factors.Keywords
This publication has 4 references indexed in Scilit:
- The High-Resolution ν7 Perpendicular Band of Jet-Cooled Si2F6Journal of Molecular Spectroscopy, 1995
- The High-Resolution ν5 Band of Jet-Cooled Si2F6Journal of Molecular Spectroscopy, 1995
- Effect of Wavelength of Infrared Laser on the Isotopeselective Decomposition of Si2F6Journal of the Japan Institute of Metals and Materials, 1994
- Isotope-selective infrared multiple photon decomposition of hexafluorodisilaneThe Journal of Physical Chemistry, 1986