Abstract
Wheat cultivar Carifen 12 from Chile possesses resistance to Septoria leaf blotch (S. tritici) and to Pyrenophora tan spot (P. tritici-repentis). Resistance of Carifen 12 to a mixture of 2 cultures of S. tritici was conditioned by a single dominant gene in the F2 and F3 from crosses with susceptible cultivars Triumph 64 and TAM W-101. Resistance of Carifen 12 to 1 culture of P. tritici-repentis was conditioned by a single recessive gene pair in the F3 of Carifen 12 .times. TAM W-101. A chi-square test for independence indicated a probable association (P = 0.05-0.10) between genes for resistance to Septoria leaf blotch and Pyrenophora tan spot.

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