A new transistor noise test set

1 January 1972

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 60 (1) , 151
https://doi.org/10.1109/PROC.1972.8587

Abstract

An instrument is proposed for measuring the equivalent noise voltage and noise current generators of bipolar and field effect transistors. This instrument uses simple feedback networks to define the gain of the measuring system.

Keywords

NOISE GENERATORS
VOLTAGE
FEEDBACK
CIRCUIT NOISE
INSTRUMENTS
IMPEDANCE
RESISTORS
CIRCUIT TESTING
CURRENT MEASUREMENT
NOISE MEASUREMENT

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