Decay of the 4dhole states of Xe studied by photoelectron-photoelectron coincidence spectroscopy

Abstract
The formation of Xe2+ by decay of 4d hole states in xenon has been investigated by observing both the N4,5OO normal Auger spectra and the resonantly excited spectra using synchrotron radiation and a new form of electron–electron coincidence spectroscopy involving a magnetic-bottle time-of-flight analyzer. Direct double Auger processes from the resonance populate all accessible states of Xe2+ while indirect processes via superexcited Xe+ levels populate ground and lower excited states of Xe2+ preferentially.