Surface Plasmons As Interfacial Light For The Characterization Of Thin Films

15 August 1989

proceedings article
Published by SPIE-Intl Soc Optical Eng

p. 46-55
https://doi.org/10.1117/12.951615

Abstract

This paper deals with the application of plasmon surface polaritions (PSP) for the characterization of thin films, e.g. Langmuir-Blodgett multilayer assemblies. Examples are given for total internal diffraction of PSP by dielectric phase gratings, interferometry at an index step and, finally, recent developments in the new field of PSP imaging and microscopy are presented.

Keywords

SURFACE PLASMONS
THIN FILMS
DIFFRACTION
INTERFEROMETRY
MICROSCOPY
MULTILAYERS
PLASMONS

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