Overlap and entanglement-witness measurements
- 17 June 2002
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 65 (6) , 062320
- https://doi.org/10.1103/physreva.65.062320
Abstract
A feasible device for measurement of fidelity, overlap, purity, and Hilbert-Schmidt distance of two mixed states is proposed. In addition, this device realizes a decomposable entanglement witness-measurement for bipartite systems, corresponding to Werner criterion of entanglement. The measurement, based on interferometric setup and the control-phase gate, can be directly implemented in the cavity quantum electrodynamics, trapped ion, and electromagnetically induced transparency experiments.Keywords
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