A low noise soft x-ray appearance potential spectrometer and its application to chemisorption of oxygen on nickel
- 1 July 1974
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 45 (7) , 877-881
- https://doi.org/10.1063/1.1686759
Abstract
A low noise soft x‐ray appearance potential spectrometer has been constructed. It consists of a liquid nitrogen‐cooled silicon surface‐barrier diode that detects the variations in the emitted photon flux. A 500 Å thick Al window acts as a discriminator for low energy photons (visible light and the tail of the bremsstrahlung). The performance of the detector arrangement has been tested on clean Ni films and chemisorbed O on these films. It is shown that the detector behaves ideally, i.e., the signal‐to‐noise ratio is limited by the shot noise in the photon flux for primary electron beam intensities in the range tested (30–600 μ A) and for electron energies, 300–900 eV.Keywords
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