High availability and reliability in the itanium processor
- 1 January 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Micro
- Vol. 20 (5) , 61-69
- https://doi.org/10.1109/40.877951
Abstract
No abstract availableKeywords
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- Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art ReviewIBM Journal of Research and Development, 1984