In Situ AES Characterization of Rotating Electrical Contacts
- 1 March 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 4 (1) , 36-40
- https://doi.org/10.1109/tchmt.1981.1135786
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- AES study of sulfur surface segregation on polycrystalline copperJournal of Vacuum Science and Technology, 1980
- The use of analytical surface tools in the fundamental study of wearWear, 1978
- Combined Mass Spectrometric and Auger Electron Spectrosopic Techniques for Metal ContactsIEEE Transactions on Parts, Hybrids, and Packaging, 1973
- Adhesion, Friction, Wear, and Lubrication Research by Modern Surface Science TechniquesJournal of Vacuum Science and Technology, 1972