Microscopic Study on the Work Function Reduction Induced by Cs-Adsorption

• 30 July 2003
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 42  (Part 1, No) , 4882-4886
• https://doi.org/10.1143/jjap.42.4882

Abstract

Keywords

• ELECTRONIC STRUCTURE
• CS
• WORK FUNCTION
• SCANNING TUNNELING MICROSCOPE