I _DDQ detectability of bridgesin CMOS sequential circuits

6 January 1994

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 30 (1) , 30-31
https://doi.org/10.1049/el:19940017

Abstract

Differences between controllability conditions for I_DDQ detectability in CMOS combinational and sequential circuits in the presence of bridging defects are presented. The usual detectability condition for current testability of bridges in combinational circuits is shown to fail for defective sequential circuits. New conditions for sequential circuits are presented.

Keywords

BRIDGING DEFECTS
CONTROLLABILITY CONDITIONS
LOGIC IC TESTING
CMOS SEQUENTIAL CIRCUITS
DETECTABILITY CONDITION
IDDQ DETECTABILITY
DEFECTIVE SEQUENTIAL CIRCUITS
CURRENT TESTABILITY

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I DDQ detectability of bridgesin CMOS sequential circuits

Abstract

Keywords

I _DDQ detectability of bridgesin CMOS sequential circuits