Current-voltage characteristics and conduction mechanisms in thin films of copper phthalocyanine with aluminium contacts
- 16 December 1974
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 26 (2) , 443-449
- https://doi.org/10.1002/pssa.2210260206
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- A Model of the Electrical Transport Phenomena in Imperfect Crystals of Copper Phthalocyanine. I. Basic Ideas and Treatment of Bulk DefectsPhysica Status Solidi (b), 1973
- Zur Textur von Aufdampfschichten des KupferphthalocyaninsCrystal Research and Technology, 1971
- Tunneling Characteristics of Al-Al2O3-Bi JunctionsJournal of the Physics Society Japan, 1970
- Effect of positive ionic space charge on electrical capacitance and schottky current in thin Al2O3 filmsThin Solid Films, 1969
- Schottky field emission through AlAl2O3Al structuresPhysics Letters A, 1967