Specular Reflection and Scatter for a Satellite Altimeter
- 1 September 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Aerospace and Electronic Systems
- Vol. AES-13 (5) , 544-546
- https://doi.org/10.1109/taes.1977.308422
Abstract
The ratio of specularly reflected to scattered power received by a radar altimeter is shown to be related to a parameter q = (4K2/σ0 ß2), where K is the Fresnel reflection coefficient, σ0 is the differential scattering coefficient, and ß is the effective beamwidth. The critical range of rms surface roughness is shown to be from 0.1 to 0.335 λ for examples from 100-ns-pulse aircraft radar to 10-ns-pulse spacecraft radar over water.Keywords
This publication has 1 reference indexed in Scilit:
- Radar Terrain Return at Near-Vertical IncidenceProceedings of the IRE, 1957