Contribution a l'etude de l'effet de charge sur echantillon isolant en spectroscopie de photoelectrons (XPS)
- 31 December 1978
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 13 (3) , 175-186
- https://doi.org/10.1016/0368-2048(78)85025-7
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Electrical charging of non-conductors in a photoelectron spectrometer; effect of X-ray source voltageJournal of Electron Spectroscopy and Related Phenomena, 1976
- Electrical characteristics of an X-ray photoelectron spectrometerJournal of Electron Spectroscopy and Related Phenomena, 1975
- Secondary electron emission and the detection of the vacuum level in ESCAJournal of Electron Spectroscopy and Related Phenomena, 1974
- About the charging effect in X-ray photoelectron spectrometryJournal of Electron Spectroscopy and Related Phenomena, 1974
- Differential sample charging in ESCAJournal of Electron Spectroscopy and Related Phenomena, 1973
- Use of an Electron Flood Gun to Reduce Surface Charging in X-Ray Photoelectron SpectroscopyApplied Physics Letters, 1972
- Determination of Charging Effect in Photoelectron Spectroscopy of Nonconducting SolidsJournal of Applied Physics, 1971