Fault generation model and mental stress effect analysis
- 1 July 1994
- journal article
- Published by Elsevier in Journal of Systems and Software
- Vol. 26 (1) , 31-42
- https://doi.org/10.1016/0164-1212(94)90093-0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
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- A literature survey of the human reliability component in a man-machine systemIEEE Transactions on Reliability, 1988
- An analysis of errors and their causes in system programsIEEE Transactions on Software Engineering, 1975