The Effect of Chemical Combination onFluorescent X-Ray Emission Lines
- 15 December 1938
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 54 (12) , 1000-1004
- https://doi.org/10.1103/physrev.54.1000
Abstract
The width and index of asymmetry of the fluorescent , and emission lines of pure Zn, Cu, Fe, Mn, Cr and 26 compounds, including the halides and sulfides of Cu and Fe, have been measured with a double crystal spectrometer. The changes between the shapes of the lines of the metals and their oxides are in good agreement with those determined by Roseberry and Bearden for the same emission lines produced by direct excitation (electron impact), and indicate that the method of excitation does not influence the shape of the lines. A study of the Cu and Fe halide and sulfide lines shows some regularities in the change of the width and index of asymmetry with the percentage composition, the most outstanding of which are for the iron sulfides FeS, , , Fe. As the percentage of sulfur increases, both the width and the index of asymmetry decrease for all lines, the maximum change being of the order of 40 percent for the width of the lines.
Keywords
This publication has 6 references indexed in Scilit:
- DieL?- undL?-Linien der Elemente 32 Ge bis 26 Fe und ihrer Verbindungen und LegierungenThe European Physical Journal A, 1938
- A Scale-of-Eight Counting UnitReview of Scientific Instruments, 1937
- Effects of Chemical Composition on X-Ray LinesPhysical Review B, 1936
- Effects of Chemical Binding on the X-RayDoublet Lines of Sulphur Studied with a Two-Crystal SpectrometerPhysical Review B, 1936
- Resolving Power of the Two-Crystal X-Ray SpectrometerReview of Scientific Instruments, 1935
- Shapes and Wavelengths ofSeries Lines of Elements Ti 22 to Ge 32Physical Review B, 1935